| New formulas of interconnect capacitances based on results of conformal mapping method F Stellari, AL Lacaita IEEE Transactions on Electron Devices 47 (1), 222-231, 2000 | 135 | 2000 |
| A novel scan chain diagnostics technique based on light emission from leakage current P Song, F Stellari, T Xia, AJ Weger 2004 International Conferce on Test, 140-147, 2004 | 84 | 2004 |
| CMOS circuit testing via time-resolved luminescence measurements and simulations F Stellari, A Tosi, F Zappa, S Cova IEEE Transactions on Instrumentation and Measurement 53 (1), 163-169, 2004 | 80 | 2004 |
| Testing and diagnostics of CMOS circuits using light emission from off-state leakage current F Stellari, P Song, JC Tsang, MK McManus, MB Ketchen IEEE transactions on electron devices 51 (9), 1455-1462, 2004 | 75 | 2004 |
| Method and apparatus for creating time-resolved emission images of integrated circuits using a single-point single-photon detector and a scanning system F Stellari, A Tosi, F Zappa, P Song US Patent 8,115,170, 2012 | 62 | 2012 |
| Verification of untrusted chips using trusted layout and emission measurements F Stellari, P Song, AJ Weger, J Culp, A Herbert, D Pfeiffer 2014 IEEE international symposium on hardware-oriented security and trust …, 2014 | 61 | 2014 |
| High-speed CMOS circuit testing by 50 ps time-resolved luminescence measurements F Stellari, F Zappa, S Cova, C Porta, JC Tsang IEEE Transactions on Electron Devices 48 (12), 2830-2835, 2002 | 58 | 2002 |
| Tools for non-invasive optical characterization of CMOS circuits F Stellari, F Zappa, S Cova, L Vendrame International Electron Devices Meeting 1999. Technical Digest (Cat. No …, 1999 | 54 | 1999 |
| MARVEL—Malicious alteration recognition and verification by emission of light P Song, F Stellari, D Pfeiffer, J Culp, A Weger, A Bonnoit, B Wisnieff, ... 2011 IEEE International Symposium on Hardware-Oriented Security and Trust …, 2011 | 49 | 2011 |
| Model-based guidelines to suppress cable discharge event (CDE) induced latchup in CMOS ICs K Chatty, P Cottrell, R Gauthier, M Muhammad, F Stellari, A Weger, ... 2004 IEEE International Reliability Physics Symposium. Proceedings, 130-134, 2004 | 46 | 2004 |
| Benchmarking at the frontier of hardware security: Lessons from logic locking B Tan, R Karri, N Limaye, A Sengupta, O Sinanoglu, MM Rahman, ... arXiv preprint arXiv:2006.06806, 2020 | 44 | 2020 |
| Transmission line pulse picosecond imaging circuit analysis methodology for evaluation of ESD and latchup A Weger, S Voldman, F Stellari, P Song, P Sanda, M McManus 2003 IEEE International Reliability Physics Symposium Proceedings, 2003 …, 2003 | 38 | 2003 |
| Self-heating characterization of FinFET SOI devices using 2D time resolved emission measurements F Stellari, KA Jenkins, AJ Weger, B Linder, P Song 2015 IEEE International Reliability Physics Symposium, 2B. 1.1-2B. 1.6, 2015 | 37 | 2015 |
| Hot-carrier photoemission in scaled CMOS technologies: a challenge for emission based testing and diagnostics A Tosi, F Stellari, A Pigozzi, G Marchesi, F Zappa 2006 IEEE International Reliability Physics Symposium Proceedings, 595-601, 2006 | 37 | 2006 |
| Broken scan chain diagnostics based on time-integrated and time-dependent emission measurements F Stellari, P Song, AJ Weger, T Xia International Symposium for Testing and Failure Analysis 30873, 52-57, 2004 | 29 | 2004 |
| Characterization of random process variations using ultralow-power, high-sensitivity, bias-free sub-threshold process sensor M Meterelliyoz, P Song, F Stellari, JP Kulkarni, K Roy IEEE Transactions on Circuits and Systems I: Regular Papers 57 (8), 1838-1847, 2010 | 28 | 2010 |
| Circuit voltage probe based on time-integrated measurements of optical emission from leakage current F Stellari, P Song, JC Tsang, MK McManus, MB Ketchen International Symposium for Testing and Failure Analysis 30774, 667-672, 2002 | 28 | 2002 |
| Self-heating measurement of 14-nm FinFET SOI transistors using 2-D time-resolved emission F Stellari, KA Jenkins, AJ Weger, BP Linder, P Song IEEE Transactions on Electron Devices 63 (5), 2016 | 27 | 2016 |
| Local probing of switching noise in VLSI chips using Time Resolved Emission (TRE) F Stellari, P Song, WD Becker North Atlantic Test Workshop (NATW), 130-137, 2005 | 27 | 2005 |
| Revealing SRAM memory content using spontaneous photon emission F Stellari, P Song, M Villalobos, J Sylvestri 2016 IEEE 34th VLSI Test Symposium (VTS), 1-6, 2016 | 26 | 2016 |
Peilin SongIBM T. J. Watson Research CenterVerified email at us.ibm.com
Franco ZappaPolitecnico di MilanoVerified email at polimi.it
Moyra McManusBlueGene/Q System Bringup Lead, IBM ResearchVerified email at us.ibm.comStas PolonskySamsung R&D Institute RussiaVerified email at samsung.com
Brian JiCollege of Nanoscale Science and Engineering, SUNY Polytechnic Institute, Albany, NYVerified email at sunycnse.com
James StathisIBM ResearchVerified email at us.ibm.com
Karl K. BerggrenProfessor of Electrical Engineering, MITVerified email at mit.edu
